Keithley 4200A-SCS – Precise semiconductor characterization system for I-V, C-V and pulse measurements
The Keithley 4200A-SCS parametric analysis system is a highly integrated, modular platform for precise electrical characterization of semiconductor devices. With its comprehensive selection of SMUs, CVUs, PMUs, and high-voltage units, the system is ideal for semiconductor research, development, and production test.
The platform combines precise I-V measurements with a resolution of up to 100 fA, low-frequency capacitance measurements (10 MHz – 10 Hz), and AC capacitance measurements in the range from 1 kHz to 10 MHz. The optional CVIV module enables seamless switching between I-V and C-V measurements – without replugging the probe station or rewiring cables.
Thanks to the ultrafast Pulse I-V Unit (PMU) and the High-Voltage Pulse Generator (PGU), transient analyses and multi-stage pulse waveforms with 10 ns resolution are also easily possible. The modular architecture allows for easy adaptation to specific measurement requirements – from sub-femtoampere current measurements to ±210 V DC sources.
The Remote Preamp/Switch (RPM) module further increases measurement accuracy by minimizing capacitive effects and extending the measurement range into the picoampere range. This makes the 4200A-SCS a future-proof solution for precise semiconductor analysis in the laboratory and production.
